Paul Mooney
17Patents
5h-index
14Co-inventors
63Inventor score
Filing activity: Jul 25, 1994 → Dec 22, 2020
Most-cited inventions
| Patent | Title | Area | Cited by | Status |
|---|---|---|---|---|
| US5517033A | Apparatus for improved image resolution in electron microscopy | Electricity | 20 | Expired |
| US5635720A | Resolution-enhancement device for an optically-coupled image sensor for an electron microscope | Electricity | 18 | Expired |
| US5818035A | Optically coupled large-format solid state imaging apparatus having edges of an imaging device | Electricity | 15 | Expired |
| US6455860B1 | Resolution enhancement device for an optically-coupled image sensor using high extra-mural absorbent fiber | Electricity | 12 | Expired |
| US5946033A | Method and apparatus for multiple read-out speeds for a CTD | Electricity | 12 | Expired |
| US6194719A | Methods and apparatus for improving resolution and reducing noise in an image detector for an electron microscope | Electricity | 5 | Expired |
| US6414309B2 | Methods and apparatus for improving resolution and reducing noise in an image detector for an electron microscope | Electricity | 5 | Expired |
| US9696435B2 | Hybrid energy conversion and processing detector | Electricity | 5 | Active |
| US6570164B2 | Resolution enhancement device for an optically-coupled image sensor using high extra-mural absorbent fiber | Electricity | 4 | Expired |
| US7964846B2 | Retractable lens-coupled electron microscope camera with image sensor in electron microscope vacuum chamber | Electricity | 4 | Active |
| US8129679B2 | Method for discrimination of backscattered from incoming electrons in imaging electron detectors with a thin electron-sensitive layer | Electricity | 2 | Active |
| US7157720B2 | Multi-mode charged particle beam device | Electricity | 1 | Expired |
| US10215865B2 | Hybrid energy conversion and processing detector | Electricity | 1 | Active |
| US9415095B2 | Method for image outlier removal for transmission electron microscope cameras | Electricity | 0 | Active |
| US8542300B2 | Method for real-time removal of vertical scan streaks in a CCD | Electricity | 0 | Active |
| US8320704B2 | Method for creating reference images in electron microscopes | Electricity | 0 | Active |
| US12057515B2 | Electronic imaging detector with thermal conduction layer | Electricity | 0 | Active |
Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.