Patent · US Expired

Semiconductor memory and method of fabricating the same

US6198122A · kind A · utility

20Cited by
2References
13Claims
0Family size

Assignee

Inventors

Key dates

Filing dateFeb 19, 1998
Grant dateMar 6, 2001
Priority date
Expiry dateFeb 19, 2018

Classification

  • Technology area (CPC H)Electricity
  • CPC primaryH10B12/033

Abstract

A semiconductor memory includes a semiconductor substrate, a memory cell portion formed on the substrate and including stacked capacitors formed on the substrate, each having a storage electrode formed on a bottom surface of a recess in an insulating layer, a capacitor insulating film formed on the storage electrode, and a plate electrode formed on the capacitor insulating film and lower than an upper edge of the recess, and a first multilayered interconnecting layer having an interconnecting layer including a plate interconnection connected to the plate electrode, and a peripheral circuit portion formed adjacent to the memory cell portion on the substrate and comprising a second multilayered interconnecting layer. The plate interconnection includes a portion so formed as to bury the recess and connected to the plate electrode, and the second multilayered interconnecting layer includes an interconnecting layer having an upper surface substantially leveled with an upper surface of the interconnecting layer including the plate interconnection of the first multilayered interconnecting layer.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.