Patent · US Expired

Timing circuit for high voltage testing

US6201752A · kind A · utility

4Cited by
2References
33Claims
0Family size

Assignee

Inventors

Key dates

Filing dateSep 20, 1999
Grant dateMar 13, 2001
Priority date
Expiry dateSep 20, 2019

Classification

  • Technology area (CPC G)Physics
  • CPC primaryG11C11/401
  • WIPO fieldComputer technology
  • WIPO sectorElectrical engineering

Abstract

A circuit is designed with a detector circuit (700) coupled between a supply voltage terminal (705) and a reference voltage terminal (755). The detector circuit produces a first control signal in response to a detected mode and produces a second control signal in response to another mode. A first circuit (205, 207) including a delay circuit receives the first control signal and a third control signal. The delay circuit produces a fourth control signal at an output terminal (215) in response to the first and third control signals. A second circuit (203) receives the second control signal and the third control signal. The second circuit produces the fourth control signal at the output terminal in response to the second and third control signals.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.