Inventor · Plano, TX, US

Scott E. Smith

80Patents
13h-index
65Co-inventors
87Inventor score

Filing activity: Jan 31, 1992 → May 25, 2023

Most-cited inventions

PatentTitleAreaCited byStatus
US6242936A Circuit for driving conductive line and testing conductive line for current leakage Physics 85 Expired
US5295101A Array block level redundancy with steering logic Physics 45 Expired
US6586979B2 Method for noise and power reduction for digital delay lines Electricity 32 Expired
US5402390A Fuse selectable timing signals for internal signal generators Physics 31 Expired
US5706234A Testing and repair of wide I/O semiconductor memory devices designed for testing Physics 29 Expired
US5410510A Process of making and a DRAM standby charge pump with oscillator having fuse selectable frequencies Physics 27 Expired
US5511025A Write per bit with write mask information carried on the data path past the input data latch Physics 26 Expired
US6118323A Electrostatic discharge protection circuit and method Physics 20 Expired
US6191644A Startup circuit for bandgap reference circuit Physics 19 Expired
US6737897B2 Power reduction for delay locked loop circuits Electricity 19 Expired
US7177208B2 Circuit and method for operating a delay-lock loop in a power saving manner Physics 18 Expired
US6134168A Circuit and method for internal refresh counter Electricity 14 Expired
US5999473A Circuit and method for internal refresh counter Physics 13 Expired
US7123522B2 Method and apparatus for achieving low power consumption during power down Physics 12 Expired
US6868019B2 Reduced power redundancy address decoder and comparison circuit Physics 10 Expired
US6546510B1 Burn-in mode detect circuit for semiconductor device Physics 10 Expired
US7729191B2 Memory device command decoding system and memory device and processor-based system using same Physics 10 Active
US7613060B2 Methods, circuits, and systems to select memory regions Emerging Cross-Sectional Technologies 9 Active
US6529422B1 Input stage apparatus and method having a variable reference voltage Physics 7 Expired
US8665663B2 Memory circuit and control method thereof Physics 6 Active
US6809970B2 Input stage apparatus and method having a variable reference voltage Physics 5 Expired
US11042436B2 Semiconductor device with modified access and associated methods and systems Physics 5 Active
US5469385A Output buffer with boost from voltage supplies Physics 5 Expired
US8519767B2 Methods, apparatuses, and circuits for bimodal disable circuits Electricity 4 Active
US6201752A Timing circuit for high voltage testing Physics 4 Expired

Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.