Patent · US Expired

Interferometric apparatus and method for measuring motion along multiple axes

US6208424A · kind A · utility

45Cited by
4References
54Claims
0Family size

Assignee

Inventor

Key dates

Filing dateAug 27, 1998
Grant dateMar 27, 2001
Priority date
Expiry dateAug 27, 2018

Classification

  • Technology area (CPC G)Physics
  • CPC primaryG01B2290/70
  • WIPO fieldMeasurement
  • WIPO sectorInstruments

Abstract

Interferometric apparatus and method by which polarization effects and stage yaw and pitch are substantially reduced. A beam redirecting means selected from the group consisting of corner mirrors, prisms, diffractive elements, holographic elements, and combinations thereof are fixedly mounted on a body capable of rectilinear motion for movement therewith. The measurement beam path to and from the redirecting means is folded at least once so that incoming and outgoing beam segments are spatially separated and substantially parallel to one another and the reference beam.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.