Peter De Groot
127Patents
33h-index
28Co-inventors
90Inventor score
Filing activity: Aug 15, 1988 → Aug 15, 2022
Most-cited inventions
| Patent | Title | Area | Cited by | Status |
|---|---|---|---|---|
| US5398113A | Method and apparatus for surface topography measurement by spatial-frequency analysis of interferograms | Physics | 174 | Expired |
| US7012700B2 | Interferometric optical systems having simultaneously scanned optical path length and focus | Physics | 101 | Expired |
| US5371587A | Chirped synthetic wavelength laser radar | Physics | 90 | Expired |
| US6195168A | Infrared scanning interferometry apparatus and method | Physics | 89 | Expired |
| US6822745B2 | Optical systems for measuring form and geometric dimensions of precision engineered parts | Physics | 75 | Expired |
| US6249351A | Grazing incidence interferometer and method | Physics | 71 | Expired |
| US6313918A | Single-pass and multi-pass interferometery systems having a dynamic beam-steering assembly for measuring distance, angle, and dispersion | Physics | 70 | Expired |
| US5671050A | Method and apparatus for profiling surfaces using diffracative optics | Physics | 68 | Expired |
| US5663793A | Homodyne interferometric receiver and calibration method having improved accuracy and functionality | Physics | 66 | Expired |
| US7324210B2 | Scanning interferometry for thin film thickness and surface measurements | Physics | 63 | Expired |
| US7139081B2 | Interferometry method for ellipsometry, reflectometry, and scatterometry measurements, including characterization of thin film structures | Physics | 62 | Expired |
| US7324214B2 | Interferometer and method for measuring characteristics of optically unresolved surface features | Physics | 61 | Active |
| US6201609A | Interferometers utilizing polarization preserving optical systems | Physics | 60 | Expired |
| US7106454B2 | Profiling complex surface structures using scanning interferometry | Physics | 60 | Expired |
| US7428057B2 | Interferometer for determining characteristics of an object surface, including processing and calibration | Physics | 59 | Active |
| US6714307B2 | Measurement of complex surface shapes using a spherical wavefront | Physics | 51 | Expired |
| US6252667A | Interferometer having a dynamic beam steering assembly | Physics | 51 | Expired |
| US5644562A | Method and apparatus for measuring and compensating birefringence in rotating disks | Physics | 46 | Expired |
| US6208424A | Interferometric apparatus and method for measuring motion along multiple axes | Physics | 45 | Expired |
| US5488477A | Methods and apparatus for profiling surfaces of transparent objects | Physics | 44 | Expired |
| US5135307A | Laser diode interferometer | Physics | 44 | Expired |
| US6219144A | Apparatus and method for measuring the refractive index and optical path length effects of air using multiple-pass interferometry | Physics | 43 | Expired |
| US5473434A | Phase shifting interferometer and method for surface topography measurement | Physics | 43 | Expired |
| US7271918B2 | Profiling complex surface structures using scanning interferometry | Physics | 41 | Expired |
| US6236507A | Apparatus to transform two nonparallel propagating optical beam components into two orthogonally polarized beam components | Physics | 41 | Expired |
Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.