Patent · US Expired

Method for forming a perovskite thin film using a sputtering method with a fully oxidized perovskite target

US6210545A · kind A · utility

3Cited by
6References
17Claims
0Family size

Assignee

Inventors

Key dates

Filing dateNov 23, 1999
Grant dateApr 3, 2001
Priority date
Expiry dateNov 23, 2019

Classification

  • Technology area (CPC C)Chemistry; Metallurgy
  • CPC primaryC23C14/088
  • WIPO fieldMaterials, metallurgy
  • WIPO sectorChemistry

Abstract

An inventive method for forming a thin film comprises the steps of preparing a sputter-target of a material which is fully oxidized and crystallized to a perovskite structure, sputter-depositing a thin film on top of a sample with the target in an inert gas atmosphere, and annealing the thin film in non-oxygen ambient. With the use of such a target, it is possible to reduce the negative ion effect during the sputter deposition and to eliminate the presence of oxygen during the annealing process.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.