Measurement probe having an internal alignment fixture
US6218826A · kind A · utility
Assignee
Inventor
Key dates
| Filing date | Apr 28, 1999 |
| Grant date | Apr 17, 2001 |
| Priority date | — |
| Expiry date | Apr 28, 2019 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01R1/067
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A measurement probe includes a sacrificial assembly fixture as part of the probe head. The probe head has probing contact at one end thereof and a transmission cable extending from the other end thereof and includes a housing having interior surfaces with the probing contact disposed in one end of the housing and the transmission cable extending from the other end. A substrate is disposed within the housing and is electrically connected to the probing contact and the transmission cable. An alignment fixture has a base with deformable ribs formed on one surface thereof and opposing sidewalls extending from the base opposite the surface with the deformable ribs. Each sidewall has an interior surface with a channel formed therein at the exposed ends of the sidewalls for engaging the substrate. The deformable ribs are disposed against a first interior surface of the housing for positioning the substrate adjacent to an opposing second interior surface of the housing and the sidewalls align the substrate between opposing interior surface opposite the first and second interior surfaces.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.