Patent · US Expired

Developers for polychloroacrylate and polychloromethacrylate based resists

US6221568A · kind A · utility

28Cited by
9References
32Claims
0Family size

Assignee

Inventors

Key dates

Filing dateOct 20, 1999
Grant dateApr 24, 2001
Priority date
Expiry dateOct 20, 2019

Classification

  • Technology area (CPC G)Physics
  • CPC primaryG03F7/325
  • WIPO fieldOptics
  • WIPO sectorInstruments

Abstract

The present invention is directed to developer compositions for poly-alpha-acrylate or methacrylate based resists giving high contrast and whose components are closely matched in boiling points. The use of the present developer improved the critical dimensional uniformity of images developed in a positive electron beam resist. More particularly, the present invention is directed to developer formulations whose compositions are directed to enhanced printed linearity, better across the plate uniformity, and improved contrast of the imaged positive resists. Such a improved developer can be used for the positive resist exposed by photons, electrons, ions, or X-rays.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.