Patent · US Expired

Protection circuit and method for protecting a semiconductor device

US6222236A · kind A · utility

11Cited by
2References
18Claims
0Family size

Assignee

Inventor

Key dates

Filing dateApr 30, 1999
Grant dateApr 24, 2001
Priority date
Expiry dateApr 30, 2019

Classification

  • Technology area (CPC H)Electricity
  • CPC primaryH01L2924/0002

Abstract

An electrostatic discharge (ESD) protection circuit (20) includes an active load circuit (22) connected to a Laterally Diffused Metal Oxide Semiconductor (LDMOS) transistor (21) having a Lightly Doped Drain (LDD). The active load circuit includes a current limiting circuit (26) and a load transistor (27). The ESD protection circuit (20) operates to protect a power transistor (16) from damage due to an electrostatic charge. During an ESD event, the LDMOS transistor (21) enters avalanche breakdown after the voltage of the electrostatic charge exceeds the breakdown voltage of the LDMOS transistor (21). The ESD protection circuit (20) provides a low resistance path during an ESD event to dissipate the electrostatic charge.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.