Electro-optical oscilloscope with improved sampling
US6232765A · kind A · utility
Assignees
Inventors
Key dates
| Filing date | Mar 12, 1999 |
| Grant date | May 15, 2001 |
| Priority date | — |
| Expiry date | Mar 12, 2019 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01R13/347
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
An electro-optic sampling oscilloscope (or EOS oscilloscope) is designed to perform measurement such that an electro-optic sampling probe (i.e., EOS probe) is brought into contact with a measured circuit. Optical pulses are input to the EOS probe, wherein they are varied in polarization states in response to the measured circuit. Then, an electric signal output from the EOS probe is amplified to produce a receiving light signal. The receiving light signal is subjected to sampling operations using a first pulse signal to produce detection data, while it is also subjected to sampling operations using a second pulse signal to produce noise data. Herein, the first pulse signal consists of pulses which emerge in synchronization with the optical pulses respectively, while the second pulse signal delays from the first pulse signal by a prescribed delay time. Then, measurement data are produced by subtracting the noise data from the detection data. The measurement data are processed so that a measured waveform representing a measurement result is displayed on a screen of the EOS oscilloscope. Thus, it is possible to obtain the measured waveform with high precision and a good S/N ratio by e…
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.