Junzo Yamada
29Patents
9h-index
20Co-inventors
75Inventor score
Filing activity: Mar 8, 1982 → Feb 22, 2002
Most-cited inventions
| Patent | Title | Area | Cited by | Status |
|---|---|---|---|---|
| US5486774A | CMOS logic circuits having low and high-threshold voltage transistors | Electricity | 82 | Expired |
| US4771404A | Memory device employing multilevel storage circuits | Physics | 75 | Expired |
| US4747080A | Semiconductor memory having self correction function | Physics | 70 | Expired |
| US5400342A | Semiconductor memory having test circuit and test method thereof | Physics | 64 | Expired |
| US4694428A | Semiconductor memory | Electricity | 26 | Expired |
| US4460998A | Semiconductor memory devices | Physics | 24 | Expired |
| US4456980A | Semiconductor memory device | Physics | 17 | Expired |
| US6166845A | Electro-optic probe | Physics | 15 | Expired |
| US6201235A | Electro-optic sampling oscilloscope | Physics | 10 | Expired |
| US6567760B1 | Electro-optic sampling oscilloscope | Physics | 8 | Expired |
| US6232765A | Electro-optical oscilloscope with improved sampling | Physics | 5 | Expired |
| US6384590B1 | Light receiving circuit for use in electro-optic sampling oscilloscope | Physics | 5 | Expired |
| US6410906B1 | Electro-optic probe | Physics | 4 | Expired |
| US6297651A | Electro-optic sampling probe having unit for adjusting quantity of light incident on electro-optic sampling optical system module | Physics | 4 | Expired |
| US6445198B1 | Electro-optic sampling probe and a method for adjusting the same | Physics | 3 | Expired |
| US6288529A | Timing generation circuit for an electro-optic oscilloscope | Physics | 3 | Expired |
| US6337565B1 | Electro-optic probe | Physics | 3 | Expired |
| US6469528B2 | Electro-optic sampling probe and measuring method using the same | Physics | 3 | Expired |
| US6507014B2 | Electro-optic probe | Physics | 2 | Expired |
| US6297650A | Electrooptic probe | Physics | 2 | Expired |
| US6288531A | Probe for electro-optic sampling oscilloscope | Physics | 2 | Expired |
| US6369562B2 | Electro-optical probe for oscilloscope measuring signal waveform | Physics | 2 | Expired |
| US6407561B1 | Probe for electro-optic sampling oscilloscope | Physics | 2 | Expired |
| US6087838A | Signal processing circuit for electro-optic probe | Physics | 1 | Expired |
| US6342783B1 | Electrooptic probe | Physics | 1 | Expired |
Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.