Patent · US Expired

Apparatus and method for measuring conductivity

US6232786A · kind A · utility

11Cited by
17References
9Claims
0Family size

Assignee

Inventor

Key dates

Filing dateJun 7, 1999
Grant dateMay 15, 2001
Priority date
Expiry dateJun 7, 2019

Classification

  • Technology area (CPC G)Physics
  • CPC primaryG01N33/18
  • WIPO fieldMeasurement
  • WIPO sectorInstruments

Abstract

An improved apparatus for measuring conductivity or resistivity compensates for series capacitance and parallel capacitance. A sine wave excitation potential is applied to the series combination of a reference resistance and a conductivity cell. The voltages across the reference resistance and the cell are sampled. To compensate for series capacitance, both sampled voltages are synchronously rectified with respect to the phase of the sampled reference resistance voltage. To compensate for parallel capacitance, both sampled voltages are synchronously rectified with respect to the phase of the sampled cell voltage. The rectified voltages are integrated and the cell conductivity or resistivity is calculated from the product of the reference resistance and the ratio of the integrated voltages.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.