Three-dimensional measurement apparatus
US6233049A · kind A · utility
17Cited by
13References
30Claims
0Family size
Assignee
Inventors
Key dates
| Filing date | Mar 22, 1999 |
| Grant date | May 15, 2001 |
| Priority date | — |
| Expiry date | Mar 22, 2019 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01B11/2518
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A three-dimensional measurement device employs a slit ray projection technique to optically determine a three-dimensional image. The device offers a choice in operating modes between high-speed measurement, high-resolution measurement and large dynamic range in the depth direction, to accommodate various situations. The different modes of operation are achieved by selectively modifying one or more of the scanning speed of a projected reference beam, the readout speed of a photosensor, the line width or line spacing of the photosensor, and the number of lines per image frame.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.