Patent · US Expired

Semiconductor memory device having high-concentration region around electric-field moderating layer in substrate

US6236085A · kind A · utility

8Cited by
29References
10Claims
0Family size

Assignee

Inventors

Key dates

Filing dateNov 10, 1997
Grant dateMay 22, 2001
Priority date
Expiry dateNov 10, 2017

Classification

  • Technology area (CPC Y)Emerging Cross-Sectional Technologies
  • CPC primaryY10S257/90

Abstract

A semiconductor memory device comprising a source and a drain formed in a P-type semiconductor substrate and a floating gate and a control gate constituting a two-layer gate. Electric-field moderating layer is provided in the P-type semiconductor substrate to contact with a side face of the drain. P-type region is formed in contact with channel region side surface and bottom surface of the electric-field moderating layer. P-type region lower part of the P-type region in contact with the bottom surface of the electric-field moderating layer is given a lower impurity concentration than P-type region side part formed at the channel region side of the electric-field moderating layer. By this means it is possible to increase the writing speed of the semiconductor memory device while suppressing delay in the switching speed during reading operation.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.