Patent · US Expired

Integrated high-performance decoupling capacitor and heat sink

US6236103A · kind A · utility

43Cited by
3References
13Claims
0Family size

Assignee

Inventors

Key dates

Filing dateMar 31, 1999
Grant dateMay 22, 2001
Priority date
Expiry dateMar 31, 2019

Classification

  • Technology area (CPC H)Electricity
  • CPC primaryH01L2924/10158
  • WIPO fieldSemiconductors
  • WIPO sectorElectrical engineering

Abstract

A significant and very effective decoupling capacitor and heat sink combination that, in a single structure provides both a heat sink and a decoupling capacitor in close proximity to the active circuit on the chip requiring either heat sinking or decoupling capacitance or both. This is achieved by forming on a semiconductor chip, having a buried oxide layer therein, an integrated high-performance decoupling capacitor that uses a metallic deposit greater than 30 microns thick formed on the back surface of the chip and electrically connected to the active chip circuit to result in a significant and very effective decoupling capacitor and heat sink in close proximity to the active circuit on the chip requiring such decoupling capacitance and heat sinking capabilities. The decoupling capacitance can use the substrate of the chip itself as one of the capacitive plates and a formed metallic deposit as the second capacitive plate which also serves as a heat sink for the active circuit formed in the chip. The structure thus provides both a significant and effective decoupling capacitance in close proximity to the active circuit on the chip requiring such decoupling capacitance as well as p…

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.