Patent · US Expired

Device probe socket forming part of a test head, interfacing between test head and a probe handler, used for device strip testing

US6242933A · kind A · utility

22Cited by
18References
15Claims
0Family size

Assignee

Inventor

Key dates

Filing dateOct 4, 1999
Grant dateJun 5, 2001
Priority date—
Expiry dateOct 4, 2019

Classification

  • Technology area (CPC Y)Emerging Cross-Sectional Technologies
  • CPC primaryY10T29/49144
  • WIPO fieldMeasurement
  • WIPO sectorInstruments

Abstract

A new probe socket is provided that allows for high speed and dependable contacting of points of contact on the Device Under Test. The new probe socket is aimed at a testing environment where semiconductor devices are mounted on device or package strips.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.