Mechanical fixture for holding electronic devices under test showing adjustments in multiple degrees of freedom

US6262582A · kind A · utility

Assignee

• International Business Machines Corporation · US

Inventors

• Dennis R. Barringer · Wallkill, US
• Mark R. LaForce · South Burlington, US
• Mark A. Marnell · Kingston, US
• Donald W. Porter · Highland, US
• Roger R. Schmidt · Poughkeepsie, US
• Wade H. White · Hyde Park, US

Key dates

• Filing date: Oct 15, 1999
• Grant date: Jul 17, 2001
• Expiry date: Oct 15, 2019

Classification

• Technology area (CPC Y): Emerging Cross-Sectional Technologies
• CPC primary: Y10S269/903
• WIPO field: Measurement
• WIPO sector: Instruments

Abstract

A fixture to hold an electronic substrate having probe areas on a top surface. The top surface of the electronic substrate is left open to provide a maximum area to couple interconnect wires for a device under test. In addition, a bottom surface of the substrate is left open to provide a maximum area to couple with a probe card in one embodiment, or a test head in another embodiment. This open bottom and open top minimize the mechanical interference with electrical connections. The substrate is planarized to a frame by one or more clamps that are attached to the frame. The clamps provide adjustment of the pressure down on the substrate in a Z-axis direction which is normal to the top surface of the substrate for providing a good connection with a planar card. In addition, the clamps provide adjustment in the an X-Y plane parallel to the frame and rotational correction about the Z-axis.