Mark R. LaForce
6Patents
6h-index
25Co-inventors
59Inventor score
Filing activity: Jan 24, 1990 → Oct 15, 1999
Most-cited inventions
| Patent | Title | Area | Cited by | Status |
|---|---|---|---|---|
| US5001423A | Dry interface thermal chuck temperature control system for semiconductor wafer testing | Physics | 143 | Expired |
| US6275051A | Segmented architecture for wafer test and burn-in | Physics | 73 | Expired |
| US5977787A | Large area multiple-chip probe assembly and method of making the same | Physics | 42 | Expired |
| US6020750A | Wafer test and burn-in platform using ceramic tile supports | Physics | 25 | Expired |
| US6504392B2 | Actively controlled heat sink for convective burn-in oven | Physics | 15 | Expired |
| US6262582A | Mechanical fixture for holding electronic devices under test showing adjustments in multiple degrees of freedom | Emerging Cross-Sectional Technologies | 14 | Expired |
Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.