Patent · US Expired

Method for fabricating a concave bottom oxide in a trench

US6265269A · kind A · utility

100Cited by
8References
14Claims
0Family size

Assignee

Inventors

Key dates

Filing dateAug 6, 1999
Grant dateJul 24, 2001
Priority date
Expiry dateAug 6, 2019

Classification

  • Technology area (CPC H)Electricity
  • CPC primaryH10D30/668

Abstract

A method for forming a concave bottom oxide layer in a trench, comprising: providing a semiconductor substrate; forming a pad oxide layer on the semiconductor substrate; forming a silicon nitride layer on the pad oxide layer; etching the silicon nitride layer, the pad oxide layer and the semiconductor substrate to form the trench in the semiconductor substrate; depositing a silicon oxide layer to refill into the trench and cover on the silicon nitride layer, wherein the silicon oxide layer has overhang portions at corners of the trench; anisotropically etching the silicon oxide layer to form a concave bottom oxide layer in the trench; etching the silicon oxide layer to remove the silicon oxide layer on the silicon nitride layer and the sidewalls of the trench; removing the silicon nitride layer and the pad oxide layer.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.