Patent · US Expired

Method of forming metal interconnect structures and metal via structures using photolithographic and electroplating or electro-less plating procedures

US6265301A · kind A · utility

20Cited by
37References
20Claims
0Family size

Assignee

Inventors

Key dates

Filing dateMay 12, 1999
Grant dateJul 24, 2001
Priority date
Expiry dateMay 12, 2019

Classification

  • Technology area (CPC H)Electricity
  • CPC primaryH01L21/76885
  • WIPO fieldSemiconductors
  • WIPO sectorElectrical engineering

Abstract

A process for forming metal interconnect structures, and metal via structures, using electroplating, or electroless plating procedures, has been developed. The process features the use of disposable conductive layers, used as seed layers for the plating procedures. After formation of the desired metal structures, on the portion of seed layer, exposed in an opening in the photoresist shape, the photoresist shape, and the underlying portion of the disposable conductive layer, are removed, resulting in the desired metal structures.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.