Patent · US Expired

Position measuring system and method for operating a position measuring system

US6265992A · kind A · utility

6Cited by

9References

9Claims

0Family size

Assignee

DR. JOHANNES HEIDENHAIN GMBH · DE

Inventors

Rainer Hagl · Cham, DE
Mathias Hausschmid · Palling, DE
Erwin Spanner · Traunstein, DE
Jurgen Thiel · Surberg, DE
Johann Streitwieser · Annaberg-Buchholz, DE

Key dates

Filing date	Jul 5, 2000
Grant date	Jul 24, 2001
Priority date	—
Expiry date	Jul 5, 2020

Classification

Technology area (CPC G)Physics
CPC primaryG01D5/2449
WIPO fieldMeasurement
WIPO sectorInstruments

Abstract

A position measuring system for the determination of the relative positions of two objects which can be moved with respect to each other, as well as a process for operating the same are disclosed, which in case of a relative movement provides at least one pair of phase-shifted analog incremental signals, and which makes possible a definite variation of the signal periods (SP) by at least one signal period variation factor (n) of the analog incremental signals transmitted to an evaluation unit arranged behind it by a signal period variation unit. The signal period variation unit furthermore comprises correction means for eliminating most varied errors in the output signals (SIN', COS'). Among these are counted errors possibly resulting during the signal period variation, as well as measurement arrangement-specific errors.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.