Inventor · Traunstein, DE

Erwin Spanner

18Patents
9h-index
21Co-inventors
72Inventor score

Filing activity: Feb 20, 1990 → Jun 8, 2015

Most-cited inventions

PatentTitleAreaCited byStatus
US5977539A Optical position-measuring device having reference mark graduation structures with chirp fields Physics 27 Expired
US5333048A Polarizing interferometric displacement measuring arrangement Physics 20 Expired
US6535290B1 Optical position measuring device with a beam splitter Physics 20 Expired
US5574560A Dual-beam interferometer with a phase grating Physics 16 Expired
US5711084A Linear encoder Physics 15 Expired
US6369951B1 Beam splitter assembly and interferometer having a beam splitter assembly Physics 14 Expired
US5786931A Phase grating and method of producing phase grating Emerging Cross-Sectional Technologies 12 Expired
US5079418A Position measuring apparatus with reflection Physics 12 Expired
US5206704A Position measuring apparatus and method of use thereof Physics 11 Expired
US5500734A Photoelectric position measuring system with integral optical circuit having phase shifted interference gratings Physics 9 Expired
US6097318A Position measuring system and method for operating a position measuring system Physics 7 Expired
US6265992A Position measuring system and method for operating a position measuring system Physics 6 Expired
US7542149B2 Optics system for an interferometer that uses a measuring mirror, a reference mirror and a beam deflector Physics 4 Active
US6907372B1 Device for position indication and detection of guidance errors Physics 4 Expired
US7701593B2 Optical position measuring arrangement Physics 2 Active
US7639366B2 Position-measuring device for determining the position of two objects movable with respect to each other along a measuring direction, and method for forming a reference pulse for such a position-measuring device Physics 2 Active
US9188424B2 Interferometer Physics 1 Active
US9733068B2 Optical position measuring device Physics 1 Active

Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.