Patent · US Expired

In-situ automated CMP wedge conditioner

US6273797A · kind A · utility

12Cited by
9References
13Claims
0Family size

Assignee

Inventors

Key dates

Filing dateNov 19, 1999
Grant dateAug 14, 2001
Priority date
Expiry dateNov 19, 2019

Classification

  • Technology area (CPC B)Performing Operations; Transporting
  • CPC primaryB24B53/12
  • WIPO fieldMachine tools
  • WIPO sectorMechanical engineering

Abstract

An apparatus and method of conditioning a CMP polishing pad to ensure consistent polishing throughout the polishing process. In particular, the apparatus consists of a translatable wedge-shaped conditioning plate, having a three point adjustable contact to ensure proper alignment with the polishing pad; a high pressure conditioning spray nozzle to clean the polishing pad and conditioning assembly throughout polishing; and a slurry dispensing nozzle to enhance planarization of the wafer. Further, the frequency of oscillation may be varied by the operator to prevent grooves from forming in the polishing pad.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.