Patent · US Expired

Method of fabricating a gate-control electrode for an IGBT transistor

US6274451A · kind A · utility

2Cited by
6References
8Claims
0Family size

Assignee

Inventors

Key dates

Filing dateOct 29, 1999
Grant dateAug 14, 2001
Priority date
Expiry dateOct 29, 2019

Classification

  • Technology area (CPC H)Electricity
  • CPC primaryH01L2924/13055
  • WIPO fieldSemiconductors
  • WIPO sectorElectrical engineering

Abstract

This method of fabricating a gate-control electrode (28) for an insulated-gate bipolar transistor, from a plate of electrically conducting material which is covered with an electrically insulating layer (22) and, on one of its large faces, delimits a connection pad intended to be soldered to the gate, includes the steps consisting in, on the pad, forming an electrically conductive layer (30) covering the electrically insulating layer (22), on the plate, forming an electrically conductive track for supplying the connection pad, and burying the supply track.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.