Semiconductor device tester and method for testing semiconductor device
US6275023A · kind A · utility
Assignee
Inventors
Key dates
| Filing date | Feb 2, 2000 |
| Grant date | Aug 14, 2001 |
| Priority date | — |
| Expiry date | Feb 2, 2020 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01R31/31905
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A semiconductor device according to the present invention comprises a first switch circuit connected between a transmission line and an input terminal of a comparator and adapted to be turned ON according to a change of a response waveform from High level to Low level to connect an impedance substantially equal to a characteristic impedance of the transmission line to the transmission line, a second switch circuit connected between the transmission line and the input terminal of the comparator and adapted to be turned ON according to a change of the response waveform from Low level to High level to connect an impedance substantially equal to the characteristic impedance of the transmission line to the transmission line, a first voltage generator circuit connected to the first switch circuit for generating a voltage for clamping the level of the response waveform at a certain Low level and a second voltage generator circuit connected to the second switch circuit for generating a voltage for clamping the level of the response waveform at a certain High level.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.