Hitachi Electronics Engineering Co., Ltd.
93Patents
2Active
93Granted
40Portfolio score
Filing activity: Nov 18, 1977 → Jun 13, 2008 · 2 expiring within 5 years
Most-cited patents
| Patent | Title | Area | Cited by | Status |
|---|---|---|---|---|
| US5903342A | Inspection method and device of wafer surface | Physics | 133 | Expired |
| US6411377B1 | Optical apparatus for defect and particle size inspection | Electricity | 92 | Expired |
| US4614427A | Automatic contaminants detection apparatus | Physics | 90 | Expired |
| US6002989A | System for quality control where inspection frequency of inspection apparatus is reset to minimize expected total loss based on derived frequency function and loss value | Emerging Cross-Sectional Technologies | 57 | Expired |
| US6515470B2 | Method and apparatus for testing IC device | Performing Operations; Transporting | 52 | Expired |
| US5694214A | Surface inspection method and apparatus | Physics | 51 | Expired |
| US6366982B1 | Raid library apparatus for transportable media and method of controlling the library apparatus | Physics | 48 | Expired |
| US5290419A | Fluorescence detection type electrophoresis apparatus | Physics | 44 | Expired |
| US6275023A | Semiconductor device tester and method for testing semiconductor device | Physics | 41 | Expired |
| US4613573A | Automatic bacterial colony transfer apparatus | Emerging Cross-Sectional Technologies | 40 | Expired |
| US5245403A | Apparatus for detecting extraneous substances on a glass plate | Physics | 39 | Expired |
| US5092011A | Disk washing apparatus | Emerging Cross-Sectional Technologies | 36 | Expired |
| US5822139A | Method of detecting thermal asperity error of MR head and magnetic disk certifier using the same method | Physics | 35 | Expired |
| US4173073A | Track displacement detecting and measuring system | Performing Operations; Transporting | 33 | Expired |
| US6509966B2 | Optical system for detecting surface defect and surface defect tester using the same | Physics | 33 | Expired |
| US5014143A | Data recording disk chuck mechanism | Physics | 31 | Expired |
| US6617603B2 | Surface defect tester | Physics | 31 | Expired |
| US5976338A | DNA analyzer | Physics | 31 | Expired |
| US5644393A | Extraneous substance inspection method and apparatus | Physics | 30 | Expired |
| US5423111A | Magnetic disk tester | Emerging Cross-Sectional Technologies | 29 | Expired |
| US5898491A | Surface defect test method and surface defect tester | Electricity | 29 | Expired |
| US5851102A | Device and method for positioning a notched wafer | Emerging Cross-Sectional Technologies | 26 | Expired |
| US4685802A | Small particle detection system | Physics | 24 | Expired |
| US5488857A | Protrusion sensor for sensing protrusion on a disc | Physics | 24 | Expired |
| US5879576A | Method and apparatus for processing substrates | Electricity | 23 | Expired |
Source: USPTO / EPO open patent data. Counts and citation impact are objective bibliographic measures.