Patent · US Expired

Method of on-chip interconnect design

US6279142A · kind A · utility

29Cited by
17References
30Claims
0Family size

Assignee

Inventors

Key dates

Filing dateOct 2, 1998
Grant dateAug 21, 2001
Priority date
Expiry dateOct 2, 2018

Classification

  • Technology area (CPC G)Physics
  • CPC primaryG06F30/367
  • WIPO fieldComputer technology
  • WIPO sectorElectrical engineering

Abstract

A method of on-chip interconnect design in an integrated circuit (IC) is provided. Fast circuit simulations of each net constituting the IC are performed for noise margin and slew rate analysis. A resistor/capacitor (RC) network for each net is generated from net lengths, and assignments of parasitic cross-coupling capacitances and shunt capacitances derived from three-dimensional field solver evaluations of pre-routing phase estimated wire geometries. If the noise margin and slew rate criteria are not satisfied for the net under simulation, the simulations are iterated, with a new wire geometry selected between iterations, until the criteria are satisfied. Each net is tagged with a wire geometry that satisfies noise margin and slew rate requirements which can then be passed to a routing tool.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.