Voltage protection circuit for semiconductor test system
US6292342A · kind A · utility
Assignee
Inventor
Key dates
| Filing date | May 21, 1999 |
| Grant date | Sep 18, 2001 |
| Priority date | — |
| Expiry date | May 21, 2019 |
Classification
- Technology area (CPC H)Electricity
- CPC primaryH02H9/04
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A voltage protection circuit for a semiconductor test system has reduced number of components and functions as an excessive voltage clamp circuit and an abnormal voltage detection circuit. The voltage protection circuit includes a switch for selecting a reference voltage out of a predetermined clamp voltage and a predetermined abnormal threshold voltage, a clamp diode connected to an output of a device under test (DUT) to open or close the output of the DUT, a buffer amplifier for providing the selected reference voltage to the clamp diode, a resister series connected between an output of the buffer amplifier and the clamp diode for detecting an abnormal voltage in the output of the DUT, and a comparator for comparing the reference voltage and an output voltage of the DUT through the diode and generating a detection signal when the output of the DUT exceeds the reference voltage.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.