Patent · US Expired

Low dielectric constant multiple carbon-containing silicon oxide dielectric material for use in integrated circuit structures, and method of making same

US6303047A · kind A · utility

40Cited by
25References
32Claims
0Family size

Assignee

Inventors

Key dates

Filing dateMar 22, 1999
Grant dateOct 16, 2001
Priority date
Expiry dateMar 22, 2019

Classification

  • Technology area (CPC Y)Emerging Cross-Sectional Technologies
  • CPC primaryY10T428/2993
  • WIPO fieldSemiconductors
  • WIPO sectorElectrical engineering

Abstract

A low dielectric constant multiple carbon-containing silicon oxide dielectric material for an integrated circuit structure is described which comprises a silicon oxide material including silicon atoms which are each bonded to a multiple carbon-containing group consisting of carbon atoms and primary hydrogens. Preferably such multiple carbon-containing groups have the general formula --(C).sub.y (CH.sub.3).sub.z, where y is an integer from 1 to 4 for a branched alkyl group and from 3 to 5 for a cyclic alkyl group, and z is 2y+1 for a branched alkyl group and 2y-1 for a cyclic alkyl group. In one embodiment the low dielectric constant multiple carbon-containing silicon oxide dielectric material is made by reacting with a mild oxidizing agent a multiple carbon-substituted silane having only primary hydrogens bonded to the carbon atoms and having the formula SiH.sub.x ((C).sub.y (CH.sub.3).sub.z).sub.(4-x), where x ranges from 1 to 3, y is an integer from 1 to 4 for a branched alkyl group and from 3 to 5 for a cyclic alkyl group, and z is 2y+1 for a branched alkyl group and 2y-1 for a cyclic alkyl group.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.