Patent · US Expired

Micro-geometry measuring device

US6314800A · kind A · utility

12Cited by
7References
4Claims
0Family size

Assignee

Inventor

Key dates

Filing dateDec 14, 1999
Grant dateNov 13, 2001
Priority date
Expiry dateDec 14, 2019

Classification

  • Technology area (CPC G)Physics
  • CPC primaryG01B3/008
  • WIPO fieldMeasurement
  • WIPO sectorInstruments

Abstract

A micro-geometry measuring device capable of reducing measuring force thereof for avoiding damage on micro-geometry of workpiece surface and measuring at a high-speed is provided. The micro-geometry measuring device has a stylus mechanism having a stylus mechanism provided to an arm and having a stylus body, a measuring force adjusting mechanism for adjusting a measuring force working between the stylus body and the workpiece, a displacement sensor for detecting a position of the arm, and a measuring force controller for controlling the measuring force adjusting mechanism. The stylus mechanism includes a vibrator for resonantly vibrating the stylus body, and a detector for detecting vibration status changing when the stylus body touches the workpiece. The change in vibration of the stylus body vibrated by the vibrator is directly detected by the detector and a signal therefrom is fed back to the measuring force controller to keep constant measuring force working between the stylus body and the workpiece.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.