Universal cleaning wafer for a plasma chamber
US6328041A · kind A · utility
6Cited by
7References
21Claims
0Family size
Assignee
Inventors
Key dates
| Filing date | Sep 18, 1998 |
| Grant date | Dec 11, 2001 |
| Priority date | — |
| Expiry date | Sep 18, 2018 |
Classification
- Technology area (CPC Y)Emerging Cross-Sectional Technologies
- CPC primaryY10S156/916
- WIPO fieldElectrical machinery, apparatus, energy
- WIPO sectorElectrical engineering
Abstract
A cleaning wafer is used during the vaporization of particulate deposits that were previously deposited on the walls of a plasma chamber. The cleaning wafer includes a first dielectric layer, a conducting layer and a second dielectric layer covering the conducting layer.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.