Patent · US Expired

Universal cleaning wafer for a plasma chamber

US6328041A · kind A · utility

6Cited by
7References
21Claims
0Family size

Assignee

Inventors

Key dates

Filing dateSep 18, 1998
Grant dateDec 11, 2001
Priority date
Expiry dateSep 18, 2018

Classification

  • Technology area (CPC Y)Emerging Cross-Sectional Technologies
  • CPC primaryY10S156/916
  • WIPO fieldElectrical machinery, apparatus, energy
  • WIPO sectorElectrical engineering

Abstract

A cleaning wafer is used during the vaporization of particulate deposits that were previously deposited on the walls of a plasma chamber. The cleaning wafer includes a first dielectric layer, a conducting layer and a second dielectric layer covering the conducting layer.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.