Patent · US Expired

Method for manufacturing low power high efficiency non-volatile erasable programmable memory cell structure

US6331463A · kind A · utility

26Cited by
6References
26Claims
0Family size

Assignee

Inventor

Key dates

Filing dateJan 18, 1999
Grant dateDec 18, 2001
Priority date
Expiry dateJan 18, 2019

Classification

  • Technology area (CPC H)Electricity
  • CPC primaryH10D30/0411

Abstract

A low power high efficiency non-volatile erasable programmable memory cell structure has a characteristic, distributed, floating gate structure comprising an assembly of independent crystalline silicon crystals. Each crystalline silicon crystal has a diameter of roughly between 10 .ANG. and 100 .ANG. and is separated from the other crystals by a distance greater than 50 .ANG..

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.