Method for generating test files from scanned test vector pattern drawings

US6332032A · kind A · utility

Assignee

• The United States of America as represented by the Secretary of the Army · US

Inventors

• Gerald T. Michael · Waretown, US
• Wei Su · Bel Air, US
• Michael A. Dukes · Austin, US

Key dates

• Filing date: Dec 3, 1998
• Grant date: Dec 18, 2001
• Expiry date: Dec 3, 2018

Classification

• Technology area (CPC G): Physics
• CPC primary: G06T2207/30148
• WIPO field: Measurement
• WIPO sector: Instruments

Abstract

A graphical bitmap image of a scanned test pattern drawing is transformed into a test file in a file format that is readily usable to provide stimuli for computer-aided design (CAD) tools or integrated circuit (IC) testing equipment. A bitmap image of each page of the test pattern drawing is produced as a graphical image of the rows and columns of test pattern data. Non-essential drawing symbols are then removed from the bitmap image, such as the lines used to draw the table. Essential test pattern information is recognized and is converted into a machine readable format by first storing the data in a tabular format having rows and columns which correspond to the rows and columns of the test pattern drawing. The stored test pattern data is then integrated with a machine readable file format which is adaptable to the CAD and IC tool in order to produce the machine readable test file.