Gerald T. Michael
6Patents
4h-index
5Co-inventors
39Inventor score
Filing activity: Jan 31, 1995 → Dec 3, 1998
Most-cited inventions
| Patent | Title | Area | Cited by | Status |
|---|---|---|---|---|
| US5570035A | Built-in self test indicator for an integrated circuit package | Physics | 30 | Expired |
| US6314194A | Method for generating computer aided design programming circuit designs from scanned images of the design | Physics | 19 | Expired |
| US5745500A | Built-in self testing for the identification of faulty integrated circuit chips in a multichip module | Physics | 18 | Expired |
| US5946415A | Method and apparatus to process drawing images | Physics | 14 | Expired |
| US6332032A | Method for generating test files from scanned test vector pattern drawings | Physics | 2 | Expired |
| US5781791A | Digital microelectronic circuit package using buffer dies and programmable device or memory dies | Electricity | 0 | Expired |
Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.