Patent · US Expired

Method for integration of integrated circuit devices

US6337265B1 · kind B1 · utility

15Cited by
4References
17Claims
0Family size

Assignee

Inventors

Key dates

Filing dateSep 1, 2000
Grant dateJan 8, 2002
Priority date
Expiry dateSep 1, 2020

Classification

  • Technology area (CPC Y)Emerging Cross-Sectional Technologies
  • CPC primaryY02E10/544
  • WIPO fieldSemiconductors
  • WIPO sectorElectrical engineering

Abstract

A method for integration of integrated circuit devices includes providing an array of first devices including dummy devices on a first chip; providing an array of contacts on a second chip; flip-chip bonding the first device to the contacts; filing the voids between the two interstitially of the first devices with an underfill; masking the first devices leaving exposed selected dummy devices; removing the dummy devices leaving an array of holes with contacts; providing a spaced array of second devices on a third chip matching the array of holes; flip-chip bonding the second devices to the contacts in the holes; and filling the voids between the chips associated with second devices with an underfill.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.