Patent · US Expired

Apparatus and method for uniformly depositing thin films over substrates

US6338775B1 · kind B1 · utility

15Cited by
8References
24Claims
0Family size

Assignee

Inventor

Key dates

Filing dateAug 7, 2000
Grant dateJan 15, 2002
Priority date
Expiry dateAug 7, 2020

Classification

  • Technology area (CPC C)Chemistry; Metallurgy
  • CPC primaryC23C14/547
  • WIPO fieldSurface technology, coating
  • WIPO sectorChemistry

Abstract

A thin film deposition apparatus and method are disclosed in this invention. The method includes a step of providing a vacuum chamber for containing a thin-film particle source for generating thin-film particles to deposit a thin-film on the substrates. The method further includes a step of containing a substrate holder in the vacuum chamber for holding a plurality of substrates having a thin-film deposition surface facing the thin-film particle source. The method further includes a step of providing a rotational means for rotating the substrate holder to rotate each of the substrates exposed to the thin-film particles for depositing a thin film thereon. And, the method further includes a step of providing a lateral moving means for laterally moving and controlling a duration of exposure time across a radial direction for each of the substrates for controlling thickness uniformity of the thin-film deposited on each of the substrates.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.