Patent · US Expired

Method for comparison between a pattern sequence and a variable length key

US6341346B1 · kind B1 · utility

6Cited by
86References
13Claims
0Family size

Assignee

Inventors

Key dates

Filing dateFeb 5, 1999
Grant dateJan 22, 2002
Priority date
Expiry dateFeb 5, 2019

Classification

  • Technology area (CPC G)Physics
  • CPC primaryG06F9/30021
  • WIPO fieldComputer technology
  • WIPO sectorElectrical engineering

Abstract

A method is disclosed for comparing a pattern sequence with a variable length key. A first bit of this sequence is identified by a pointer, the length and the location of the key are identified by a code word (W, S), the method includes a preliminary step of identifying the sequence and then performing a comparison with the variable length key.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.