Patent · US Expired

Method and apparatus for detecting origin of measurement

US6342697B1 · kind B1 · utility

15Cited by
20References
7Claims
0Family size

Assignee

Inventors

Key dates

Filing dateSep 17, 1999
Grant dateJan 29, 2002
Priority date
Expiry dateSep 17, 2019

Classification

  • Technology area (CPC H)Electricity
  • CPC primaryH03M1/308
  • WIPO fieldBasic communication processes
  • WIPO sectorElectrical engineering

Abstract

An interpolation circuit generates two-phase square wave signals PA and PB from two-phase sinusoidal wave outputs ØA and ØB supplied from a photoelectric encoder. A gate signal generator slices a primary origin signal ØZ supplied from the photoelectric encoder with a predetermined reference level VRef to generate a gate signal Z. A first counter begins to count position pulses generated from the two-phase square wave signals PA and PB when the gate signal Z becomes active. A count value of the first counter is divided by two when the gate signal Z becomes non-active and the divided value is preset into a second counter. The second counter counts the position pulses generated from the two-phase square wave signals PA and PB. A comparator feeds an output origin signal PZ when a count value of the second counter reaches a predetermined offset value N.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.