Patent · US Expired

Diode defect detecting device

US6342791B1 · kind B1 · utility

8Cited by
2References
9Claims
0Family size

Assignees

Inventors

Key dates

Filing dateFeb 10, 2000
Grant dateJan 29, 2002
Priority date
Expiry dateFeb 10, 2020

Classification

  • Technology area (CPC G)Physics
  • CPC primaryG01R31/27
  • WIPO fieldMeasurement
  • WIPO sectorInstruments

Abstract

This invention is a diode defect detecting device including a current detector for detecting the primary current of a transformer, a comparator for comparing the detection current detected by the current detector with a current reference and outputting a reset signal if the detection current is larger than the current reference, an oscillator for generating a clock signal, a flip-flop circuit for receiving a set signal on the basis of a front and an end edge of the clock signal generated by the oscillator and receiving the output reset signal from the comparator, a polarity changing circuit for outputting a polarity changing signal for changing the polarities of the plurality of diodes on the basis of the output clock signal from the flip-flop circuit, and a determination circuit for calculating, in order to detect malfunctions of the plurality of diodes, any impedance change on the secondary side viewed from the primary side of the transformer on the basis of the pulse width of each polarity of the output clock signal from the flip-flop circuit.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.