Patent · US Expired

Guide device for testing elongated objects

US6344740B1 · kind B1 · utility

3Cited by
10References
28Claims
0Family size

Assignee

Inventor

Key dates

Filing dateMay 25, 1999
Grant dateFeb 5, 2002
Priority date
Expiry dateMay 25, 2019

Classification

  • Technology area (CPC B)Performing Operations; Transporting
  • CPC primaryB65H2601/524
  • WIPO fieldMeasurement
  • WIPO sectorInstruments

Abstract

A guide device for linear guidance of elongated objects, particularly for positioning wires passing a nondestructive eddy current test device, can be the inlet nozzle or outlet nozzle, and has a brush arrangement integrated into a guide sleeve. The brush arrangement damps vibration of the wires or other elongated objects transiting the test device. A wire guided by the guide device is protected at its surface and subjected to little or no transverse vibration in the vicinity of the test probe of the test device, resulting in improved measurement accuracy.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.