Patent · US Expired

Chip interconnect and packaging deposition methods and structures

US6355153B1 · kind B1 · utility

104Cited by
11References
11Claims
0Family size

Assignee

Inventors

Key dates

Filing dateSep 17, 1999
Grant dateMar 12, 2002
Priority date
Expiry dateSep 17, 2019

Classification

  • Technology area (CPC H)Electricity
  • CPC primaryH01L2924/3011
  • WIPO fieldSurface technology, coating
  • WIPO sectorChemistry

Abstract

The present invention relates to a method for fabricating high performance chip interconnects and packages by providing methods for depositing a conductive material in cavities of a substrate in a more efficient and time saving manner. This is accomplished by selectively removing portions of a seed layer from a top surface of a substrate and then depositing a conductive material in the cavities of the substrate, where portions of the seed layer remains in the cavities. Another method includes forming an oxide layer on the top surface of the substrate such that the conductive material can be deposited in the cavities without the material being formed on the top surface of the substrate. The present invention also discloses methods for forming multi-level interconnects and the corresponding structures.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.