Device with asymmetrical channel dopant profile
US6355954B1 · kind B1 · utility
Assignee
Inventors
Key dates
| Filing date | Feb 17, 1999 |
| Grant date | Mar 12, 2002 |
| Priority date | — |
| Expiry date | Feb 17, 2019 |
Classification
- Technology area (CPC Y)Emerging Cross-Sectional Technologies
- CPC primaryY10S257/905
- WIPO fieldSemiconductors
- WIPO sectorElectrical engineering
Abstract
A method for fabricating a bit line junction in a DRAM array device which improves the doping profile in the channel region. The method includes contradoping via ion implantation through the bit line contact opening made in the device during processing. This particular doping method increases the concentration of dopants in the channel region on the bit line side of the array, without a corresponding increase of dopants on the buried strap side. Such a doping profile results in an improvement in the off current behavior of the device. Depending on the aspect ratio of the contact opening, tilt angles for the ion implantation are possible and can be adjusted for maximum off current efficiency.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.