Patent · US Expired

Automated multi-chip module handler, method of module handling, and module magazine

US6356094B1 · kind B1 · utility

8Cited by
24References
18Claims
0Family size

Assignee

Inventors

Key dates

Filing dateNov 29, 2000
Grant dateMar 12, 2002
Priority date
Expiry dateNov 29, 2020

Classification

  • Technology area (CPC G)Physics
  • CPC primaryG01R31/2887
  • WIPO fieldMeasurement
  • WIPO sectorInstruments

Abstract

An automated method of handling multi-chip modules (MCMs) in conjunction with automated module testing. The method includes providing a plurality of MCMs in a magazine at an input location and positively displacing the magazine through an indexing device. At the indexing device, the MCMs are each positively retreived and guided to a test site, tested, and positively ejected for sorting according to the results of the testing. Depending on the testing results, the MCMs may be placed in a shipping tray or in a discard bin. The emptied magazine is further displaced to an output location where it may be stacked with similar emptied magazines.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.