Method and apparatus for jitter analysis
US6356850B1 · kind B1 · utility
43Cited by
4References
37Claims
0Family size
Assignee
Inventors
Key dates
| Filing date | Jan 29, 1999 |
| Grant date | Mar 12, 2002 |
| Priority date | — |
| Expiry date | Jan 29, 2019 |
Classification
- Technology area (CPC H)Electricity
- CPC primaryH04L1/205
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A method, apparatus, and article of manufacture for separating the components of a jitter signal. The method includes the steps of obtaining measurements of the spans of a signal, generating variation measurements for each of the spans, transforming the variation estimates from a time domain to a frequency domain, and determining the random component and the periodic component of the jitter signal.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.