Wavecrest Corporation
10Patents
0Active
10Granted
33Portfolio score
Filing activity: Mar 13, 1998 → Jan 10, 2006
Most-cited patents
| Patent | Title | Area | Cited by | Status |
|---|---|---|---|---|
| US6356850B1 | Method and apparatus for jitter analysis | Electricity | 43 | Expired |
| US6298315A | Method and apparatus for analyzing measurements | Physics | 34 | Expired |
| US6185509A | Analysis of noise in repetitive waveforms | Physics | 29 | Expired |
| US6194925A | Time interval measurement system incorporating a linear ramp generation circuit | Physics | 14 | Expired |
| US6449570B1 | Analysis of noise in repetitive waveforms | Physics | 14 | Expired |
| US6799144B2 | Method and apparatus for analyzing measurements | Physics | 11 | Expired |
| US6393088B1 | Measurement system with a frequency-dividing edge counter | Physics | 8 | Expired |
| US7016805B2 | Method and apparatus for analyzing a distribution | Electricity | 4 | Expired |
| US6813589B2 | Method and apparatus for determining system response characteristics | Electricity | 2 | Expired |
| US7305312B2 | Method and apparatus for recording a real time signal | Physics | 1 | Expired |
Source: USPTO / EPO open patent data. Counts and citation impact are objective bibliographic measures.