Patent · US Expired

Method and apparatus for digital delay locked loop circuits

US6359482B1 · kind B1 · utility

14Cited by
11References
22Claims
0Family size

Assignee

Inventors

Key dates

Filing dateAug 30, 2000
Grant dateMar 19, 2002
Priority date
Expiry dateAug 30, 2020

Classification

  • Technology area (CPC Y)Emerging Cross-Sectional Technologies
  • CPC primaryY10S331/02
  • WIPO fieldBasic communication processes
  • WIPO sectorElectrical engineering

Abstract

A method and apparatus for improving a delay line circuit of a Digital Delay Lock Loop (DDLL) circuit. Each delay stage of the delay line consists of three gates, two NANDs and one inverter. The reduction in the total number of gates decreases the unit delay time for each stage, improving the resolution of each stage of the delay line. In addition, the reduction in the total number of gates in each stage significantly reduces the amount of space necessary for the circuitry of the delay line, resulting in an overall decrease in the size of the DDLL circuit.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.