Patent · US Expired

Stacked chip scale package

US6365966B1 · kind B1 · utility

35Cited by
2References
23Claims
0Family size

Assignee

Inventors

Key dates

Filing dateAug 7, 2000
Grant dateApr 2, 2002
Priority date
Expiry dateAug 7, 2020

Classification

  • Technology area (CPC H)Electricity
  • CPC primaryH01L2924/181
  • WIPO fieldSemiconductors
  • WIPO sectorElectrical engineering

Abstract

A stacked chip scale package. The stacked chip scale package has a substrate having mounting pads arranged to lie close to the rectangular sides. A smaller silicon chip is stacked on the active surface of a larger silicon chip and the larger silicon chip rest on the substrate. The mounting pads on the substrate are distributed around the periphery of the lower silicon chip. Both the upper silicon chip and the lower silicon chip have only one pair of opposite sides having bonding pads. The pair of edges of the upper silicon chip with bonding pads nearby is parallel to the pair of edges of the lower silicon chip without bonding pads. The bonding pads on the upper chip and the lower chip are electrically connected to their neighboring mounting pads through conductive wires. The conductive wires, the upper silicon chip, the lower silicon chip and a portion of the substrate are enclosed by packaging material.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.