Multi-beam scanning method, apparatus and multi-beam light source device achieving improved scanning line pitch using large light emitting points interval
US6366384B1 · kind B1 · utility
Assignee
Inventors
Key dates
| Filing date | Jun 15, 1999 |
| Grant date | Apr 2, 2002 |
| Priority date | — |
| Expiry date | Jun 15, 2019 |
Classification
- Technology area (CPC Y)Emerging Cross-Sectional Technologies
- CPC primaryY10S359/90
- WIPO fieldTextile and paper machines
- WIPO sectorMechanical engineering
Abstract
A multi-beam scanning method for scanning a scanning surface with a plurality of beams which are formed into a plurality of beam spots separated from each other in a sub scanning direction includes providing n number of semiconductor laser array units, each of the n number of semiconductor laser array units having m number of light emitting points, where n is not equal to 1 and m is not equal to 1, coupling light beams emitted from the light emitting points of the semiconductor laser arrays, synthesizing the coupled beams with a beam synthesizing device to obtain m×n number of beams and deflecting the m×n number of beams at substantially the same time such that the deflected beams are impinged on the scanning surface.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.