Patent · US Expired

Ferroelectric non-volatile memory cell integrated in a semiconductor substrate

US6366488B1 · kind B1 · utility

4Cited by
1References
13Claims
0Family size

Assignee

Inventors

Key dates

Filing dateApr 28, 2000
Grant dateApr 2, 2002
Priority date
Expiry dateApr 28, 2020

Classification

  • Technology area (CPC H)Electricity
  • CPC primaryH10B53/30
  • WIPO fieldComputer technology
  • WIPO sectorElectrical engineering

Abstract

Presented is a ferroelectric non-volatile memory cell in a semiconductor substrate that has a MOS device connected in parallel to a ferroelectric capacitor. The MOS device has first and second conduction terminals and is covered with an insulating layer. The ferroelectric capacitor has a lower electrode formed on the insulating layer above the first conduction terminals and are electrically coupled to them. The lower electrode of the ferroelectric capacitor is covered with a layer of ferroelectric material and coupled capacitively to an upper electrode. The upper electrode is formed above the second conduction terminals and are electrically connected thereto, and extends over the ferroelectric material to at least partially overlap the lower electrode. Also presented is a non-volatile memory matrix that includes a plurality of the ferroelectric memory cells that are organized into rows and columns.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.